25–27 Mar 2026
Asia/Taipei timezone

Atomic-Scale Characterization of Iron Oxide Thin Film on Ag(001) by Scanning Tunneling Microscopy

25 Mar 2026, 13:35
3m
Condensed Matter Experiment Poster Talks

Speaker

Yi-Chun Huang (Department of Physics, National Tsing Hua University, Hsinchu, Taiwan)

Description

High resolution scanning tunneling microscopy has been used to characterize the structural properties and growth mechanism of iron oxide thin film deposited on an Ag(001) substrate. Our experimental results show that the FeO(111) monolayer exhibits a c(2 × 10)/p(2 × 11)/c(2 × 12) unit cell due to lattice matching between the hexagonal overlayer and square substrate lattices. Besides, line defects with locally square atomic coordination are formed due to the excess oxygen in FeO thin film. Our findings provide a platform for understanding the metal oxide-substrate interactions down to atomic scale.

Authors

Yi-Chun Huang (Department of Physics, National Tsing Hua University, Hsinchu, Taiwan) Fang-Tzu Chang (Department of Physics, National Tsing Hua University, Hsinchu, Taiwan) Yu-Tung Lin (Department of Physics, National Tsing Hua University, Hsinchu, Taiwan) Chia-Ju Chen (Department of Physics, National Tsing Hua University, Hsinchu, Taiwan) Pin-Jui Hsu (Department of Physics, National Tsing Hua University, Hsinchu, Taiwan)

Presentation materials